Category Archives: IEC

IEC 60068-2-69 Ed. 3.0 b:2017

Environmental testing – Part 2-69: Tests – Test Te/Tc: Solderability testing of electronic components and printed boards by the wetting balance (force measurement) method

Published by: 2017-03-07 / 2017-03-07 / 110 pages
IEC 60068-2-69:2017 outlines test Te/Tc, the solder bath wetting balance method and the solder globule wetting balance method to determine, quantitatively, the solderability of the terminations. Data obtained by these methods are not intended to be used as absolute quantitative data for pass–fail purposes.
The procedures describe the solder bath wetting balance method and the solder globule wetting balance method. They are applicable to components and printed boards with metallic terminations and metallized solder pads.
This document provides the measurement procedures for solder alloys both with and without lead (Pb).
This edition includes the following significant technical changes with respect to the previous edition:
– integration of IEC 60068-2-54;
– inclusion of tests of printed boards;
– inclusion of new component types, and updating test parameters for the whole component list;
– inclusion of a new gauge R & R test protocol to ensure that the respective wetting balance equipment is correctly calibrated.

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IEC 62127-2 Ed. 1.2 b:2017

Ultrasonics – Hydrophones – Part 2: Calibration for ultrasonic fields up to 40 MHz CONSOLIDATED EDITION

Published by: 2017-03-22 / 2017-03-22 / 388 pages
IEC 62127-2:2007+A1:2013+A2:2017 specifies absolute hydrophone calibration methods and relative (comparative) hydrophone calibration methods. This standard is applicable to:
– hydrophones used for measurements made in water and in the ultrasonic frequency range up to 40 MHz;
– hydrophones employing circular piezoelectric sensor elements, designed to measure the pulsed wave and continuous wave ultrasonic fields generated by ultrasonic equipment;
– and hydrophones with or without a hydrophone pre-amplifier. IEC 62127-1, IEC 62127-2 and IEC 62127-3 are being published simultaneously. Together these cancel and replace IEC 60866:1987, IEC 61101:1991, IEC 61102:1991, IEC 61220:1993 and IEC 62092:2001. The contents of the corrigendum of August 2008 have been included in this copy. The French version of this standard has not been voted upon. This consolidated version consists of the first edition (2007), its amendment 1 (2013) and its amendment 2 (2017). Therefore, no need to order amendment in addition to this publication.

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IEC 62321-7-2 Ed. 1.0 b:2017

Determination of certain substances in electrotechnical products – Part 7-2: Hexavalent chromium – Determination of hexavalent chromium (Cr(VI)) in polymers and electronics by the colorimetric method

Published by: 2017-03-28 / 2017-03-28 / 35 pages
IEC 62321-7-2:2017 describes procedures to measure hexavalent chromium, Cr(VI), quantitatively in samples of polymers and electronics. This method employs organic solvent to dissolve or swell the sample matrix, followed by an alkaline digestion procedure to extract Cr(VI) from samples. Studies have shown that organic/alkaline solution is more effective than acidic solution in extracting Cr(VI) from soluble and insoluble samples. Minimal reduction of Cr(VI) to Cr(III) or oxidation of Cr(III) to Cr(VI) occurs under alkaline conditions. The first edition of IEC 62321:2008 was a ‘stand-alone’ standard that included an introduction, an overview of test methods, a mechanical sample preparation as well as various test method clauses. This first edition of IEC 62321-7-2 is a partial replacement of IEC 62321:2008, forming a structural revision and generally replacing Annex C. IEC 62321-7-2 is the final replacement part of the corresponding clauses in IEC 62321:2008.

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IEC/TR 62977-2-3 Ed. 1.0 en:2017

Electronic display devices – Part 2-3: Measurements of optical properties – Multi-colour test patterns

Published by: 2017-03-09 / 2017-03-09 / 16 pages
IEC TR 62977-2-3:2017 (E), which is a Technical Report, reviews the impact of test pattern colour content and image loading on the measured display's photometric and colorimetric performance. Experimental data for several display technologies is presented to demonstrate the need for using a broader range of colours in the test patterns, and measuring the display at an image loading level appropriate for the intended application.

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IEC 62680-3-1 Ed. 1.0 en:2017

Universal Serial Bus interfaces for data and power – Part 3-1: Universal Serial Bus 3.1 Specification

Published by: 2017-03-07 / 2017-03-07 / 639 pages
IEC 62680-3-1:2017(E) defines the latest generation USB industry standard, USB 3.1. The specification describes the protocol definition, types of transactions, bus management, and the programming interface required to design and build systems and peripherals that are compliant with this specification. USB 3.1 is primarily a performance enhancement to SuperSpeed USB 3.0 resulting in providing more than double the bandwidth for devices such as Solid State Drives and High Definition displays. It refers to Enhanced SuperSpeed as a collection of features or requirements that apply to both USB 3.0 and USB 3.1 bus operation. Additionally, where specific differences exist with regard to the USB 3.0 definition of SuperSpeed features or requirements, those differences will be uniquely identified as SuperSpeedPlus (or SSP) features or requirements – generally, “SuperSpeed” is in reference to 5 Gbps operation and “SuperSpeedPlus” is in reference to 10 Gbps operation.

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IEC 60154-4 Ed. 2.0 b:2017

Flanges for waveguides – Part 4: Relevant specifications for flanges for circular waveguides

Published by: 2017-03-22 / 2017-03-22 / 33 pages
IEC 60154-4:2017 specifies the dimensions of flanges for circular waveguides for use in electronic equipment.
It covers requirements for flanges drilled before or after mounting on waveguides.
The aim of this document is to specify for waveguide flanges the mechanical requirements necessary to ensure compatibility and, as far as practicable, interchangeability as well as to ensure adequate electrical performance.
This edition includes the following significant technical changes with respect to the previous edition:
– revise the estimation for return loss at connection interface of waveguides;
– add two type of waveguide flange for high frequency application, i.e. over 50 GHz;
– expand the operation frequency range up to 3,3 THz;
– rename the frequency band over R1200, i.e. R1.2K.

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IEC 60335-2-38 Ed. 5.2 b:2017

Household and similar electrical appliances – Safety – Part 2-38: Particular requirements for commercial electric griddles and griddle grills CONSOLIDATED EDITION

Published by: 2017-03-24 / 2017-03-24 / 123 pages
IEC 60335-2-38:2002+A1:2008+A2:2017 deals with the safety of electrically operated commercial griddles and griddle grills not intended for household use, their rated voltage being not more than 250 V for single-phase appliances connected between one phase and neutral and 480 V for other appliances. This consolidated version consists of the first edition (2002), its amendment 1 (2008) and its amendment 2 (2017). Therefore, no need to order amendment in addition to this publication.

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IEC 60749-28 Ed. 1.0 en:2017

Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level

Published by: 2017-03-28 / 2017-03-28 / 44 pages
IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex I.
The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.

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IEC GUIDE 119 Ed. 1.0 en:2017

Preparation of energy efficiency publications and the use of basic energy efficiency publications and group energy efficiency publications

Published by: 2017-03-28 / 2017-03-28 / 24 pages
IEC Guide 119:2017(E) defines procedures for the preparation of energy efficiency (EE) publications and describes the relationship between technical committees (TCs) with group EE functions.
In the context of this Guide, “EE” refers to energy efficiency of products, systems and organizations.
It uses the boundary concept to address energy efficiency aspects (see IEC Guide 118) in the context of a systems approach.
This Guide is relevant to every TC which would like to publish a document dealing with EE.

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